Swab Method for TC – Determination of polluted surfaces
Aplikace
| 2000 | Shimadzu
TOC
Instrumentace
TOC
Výrobce
Shimadzu
Zaměření
Agilent ICP-MS Journal (May 2022, Issue 88)
Ostatní
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS, Laserová ablace
Instrumentace
ICP/MS, ICP/MS/MS, Laserová ablace
Výrobce
Agilent Technologies
Zaměření
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)