WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN
Postery
| 2011 | Agilent Technologies
ICP-OES
Instrumentace
ICP-OES
Výrobce
Agilent Technologies
Zaměření
Quantitative Depth Profile (QDP) Analysis of Carburized Steel