Process Analytics Showdown: Putting the Fun in Fundamentals

Get ready to dive into the thrilling world of process analytics - game show style!
Join us for an engaging and educational event as you showcase your knowledge by answering questions to discover how process analyzers can be equipped with titration, ion chromatography or spectroscopy to solve even the toughest challenges.
Our hosts, Elena Hagemann, Product Manager for Process Spectroscopy, and Kraig Kmiotek, Product Manager for Process Wet Chemistry, will test your knowledge while introducing the FUNdamentals of process analytics and unraveling practical insights that can be applied in real-world situations.
Whether you're a seasoned expert or just curious about the basics, this interactive event promises to educate and entertain, combining the fun of a game show with the science and engineering of process analytics.
Register now, don’t miss out on the end-of-the-year fun!
Presenter: Kraig Kmiotek (Product Manager for Process Wet Chemistry, Metrohm USA)
Kraig Kmiotek is the Product Manager for Process Wet Chemistry at Metrohm USA and has a Bachelor of Science in Chemistry from Purdue University. Since joining the Process Analytics team, his focus has been on application work, analyzer design and programming and customer and internal training of process analyzers. He is currently responsible for understanding customer requirements, driving product and service development, and strategic product marketing and demand generation.
Presenter: Elena Hagemann (Product Manager for Process Spectroscopy, Metrohm USA)
Elena Hagemann is the Product Manager for Process Spectroscopy at Metrohm USA in Riverview, Florida. She holds a master’s degree in Analytical and Bioanalytical Chemistry from the Applied University of Aalen, Germany, where her master thesis focused on Karl Fischer Titration, NIR Spectroscopy, and Multivariate Data Analysis. Elena joined the Metrohm Group in August 2013 and started with Metrohm USA in January 2018, focusing on Raman and NIR Spectroscopy.
