X-Ray Photoelectron Spectroscopy Technology
Over the past few decades, the widespread utility and applicability of X-ray photoelectron spectroscopy (XPS) in research and development has made it the most popular and widely used technique of surface analysis.
Our latest generation spectrometer, the AXIS Supra+, combines market leading spectroscopic and imaging capabilities with automation to ensure high sample throughput and ease of use. State-of-the-art performance including fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterisation with selected area analysis. We demonstrate the capabilities of the AXIS Supra+ and the technique of XPS in answering materials characterisation questions in application areas such as thin-films, biomaterials and Li-ion batteries.
Learning Objectives:
Understand the basic principles of XPS Instrumentation
Achieve a total peace of mind for user through the highest level of automation
Understand importance of high sensitivity & high energy resolution XPS
Explore new opportunities by high spatial resolution parallel imaging
Presenter: Simon Hutton (Ph.D.) (Sales Manager, Kratos Analytical Ltd)
Dr. Hutton is currently Sales Manager for surface analysis products at Kratos Analytical. He started as an applications specialist and still has a 'hands-on' approach to instrument sales, acquiring applications data when time allows. Simon has many years experience of XPS and surface analysis.
Presenter: Adam Roberts (Ph.D.) (Marketing Manager, Kratos Analytical Lt)
Dr. Roberts joined Kratos Analytical as an Applications Specialist in the Surface Analysis business in 1998. With over 20 years of experience in applications of surface analysis for materials characterisation Adam has great depth of knowledge of the subject. This scientific experience has been developed in parallel with commercial sales and marketing of the scientific instruments supplied by Kratos Analytical.
