Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices

Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW matrices.

Presenter: Bert Woods (Application Scientist, Agilent Technologies, Inc.)

Joined the Agilent ICP-MS team in 2004, with previous employment in the semiconductor industry with Dominion Semiconductor (IBM/Toshiba) and Micron. Bert is a 1997 Chemistry graduate of Radford University in Virginia and an avid Washington DC Sports fan.