The Need for Speed: Improving Throughput and Reducing Maintenance in ICP-MS

High throughput of metals analysis requires optimization of sample introduction components and simple routine maintenance for success in the laboratory.

This webinar will discuss the optimization of the six port valve system (ISIS3) and the utilization of HMI/UHMI to reduce the amount of periodic maintenance required to assure your ICP-MS is running for high throughput with precise results.

Presenter: L. Craig Jones (ICP-MS Application Scientist, Agilent Technologies, Inc.)

Craig has been with Agilent for over 15 years as an ICP-MS applications scientist. He has been involved with multiple type of applications for ICP-MS, including environmental, pharmaceutical, nutraceutical, semiconductor, geologic, and clinical analyses, to name a few. Previous to Agilent he worked in an environmental lab performing analysis and supervising both the inorganic and organic sections of the laboratory. In his spare time, Craig enjoys volunteering at the local marine science center, mountain biking, hiking and relaxing at the beach. Craig obtained a bachelor of science degree in chemistry from Fort Lewis College in Durango, CO.