Effortless Trace Element Analysis: Avoid Common Time Traps with a Smart ICP-MS

Trace elemental analysis by inductively coupled plasma–mass spectrometry (ICP-MS) is an essential analysis technique in regulated and non-regulated laboratories.

Join us to learn how advances in ICP-MS are unlocking the true potential of this technique by removing barriers and providing significant insights that simplify workflows and reduce common time traps in ICP-MS analysis.

Presenter: L. Craig Jones (ICP-MS Application Scientist, Agilent Technologies, Inc.)

Craig has been with Agilent for over 15 years as an ICP-MS applications scientist. He has been involved with multiple type of applications for ICP-MS, including environmental, pharmaceutical, nutraceutical, semiconductor, geologic, and clinical analyses, to name a few. Previous to Agilent he worked in an environmental lab performing analysis and supervising both the inorganic and organic sections of the laboratory. In his spare time, Craig enjoys volunteering at the local marine science center, mountain biking, hiking and relaxing at the beach. Craig obtained a bachelor of science degree in chemistry from Fort Lewis College in Durango, CO.