Industrial applications of micro-XRF – Quality control at different stages
What to expect?
Micro-XRF as an analytical technique has a wide range of possible applications, but it is often considered to be most suitable for research labs and academic environments. This sentiment is needlessly restrictive - micro-XRF can be applied just as well across multiple stages of industrial processes.
For the materials testing of incoming goods - a task where bulk XRF is well-established - micro-XRF can go one step beyond precise quantitative analysis by also revealing component level alterations, be they accidental or intentional.
While true in-line analysis of products remains a very challenging task, investigating individual conspicuous components is another area of application. The origin of changed material properties like colour, wear or corrosion resistance may, for example, be traced back to the inclusion of foreign bodies that hint at wear of machinery in the production process.
For quality control, micro-XRF can assist by providing measures of layer thickness, composition, and the homogeneity of crystal structure orientation.
This webinar highlights how micro-XRF is a versatile and powerful technique suitable for use in various industrial processes, not just academic research. Examples that will be presented include the quality control of thin layer samples and foreign body identification in the manufacturing process of battery electrodes.
Who should attend?
- Micro-XRF users in industry
- Quality control specialists assuring composition of metal or glass samples as well as failure analysis specialists in industry and material research laboratories
- Researchers who work in R&D
Live Session 1* October 15th
- 10 am CEST / Berlin
- 4 pm SGT / Singapore
- 5 pm JST / Tokyo
Live Session 2* October 15th
- 5 pm CEST / Berlin
- 8 am PDT / Los Angeles
- 11 am EDT / New York
* the content of both sessions is identical
Presenter: Falk Reinhardt (Senior Application Scientist micro-XRF, Bruker Nano Analytics)
Presenter: Dr. Christian Hirschle (Application Scientist micro-XRF, Bruker Nano Analytics)
