Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR
We kindly invite you to join us for this live webinar: An Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR.
Infrared (IR) spectroscopy is a commonly used characterization technique for organic materials and many inorganic compounds and crystals. While powerful, it is limited by the diffraction limit to resolution on the order of several microns, and the lateral resolution is strongly dependent on the wavelength.
Photothermal AFM-IR is a novel technique which offers IR spectroscopy and imaging on materials with a lateral resolution 1000x better than traditional FTIR and <1 nm detection sensitivity with model-free interpretation. AFM-IR achieves this by using an AFM probe as the detector of photothermal expansion. This opens a variety of applications on both organic and inorganic materials where nanometer sensitivity and resolution are key.
In this webinar we will:
- Introduce the photothermal AFM-IR technique
- Explore the surprisingly simple mechanism underlying the technique
- Highlight a few of its many broad applications
- Offer a demonstration of photothermal AFM-IR on the Dimension IconIR system
Presenter: Peter De Wolf, Ph.D., (Director of Technology & Application Development)
Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.
Presenter: Cassandra Phillips, Ph.D. (Application Scientist, Bruker)
Cassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.
Presenter: Dr. Qichi Hu, (Senior Applications Scientist )
Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.
