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X-ray
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Structural Analysis of Battery Components and Materials Using XRD, XRM / Micro-CT and EBSD

ZÁZNAM | Proběhlo Út, 18.11.2025
Připojte se k webináři a zjistěte, jak lze kombinovat XRD, XRM a EBSD, abyste získali hlubší vhled do materiálů a procesů, které jsou pro bateriový průmysl zásadní.
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Bruker: Structural Analysis of Battery Components and Materials Using XRD, XRM / Micro-CT and EBSD
Bruker: Structural Analysis of Battery Components and Materials Using XRD, XRM / Micro-CT and EBSD

Discover how advanced analytical techniques are shaping the future of battery innovation

Join us for a free, 60-minute online seminar to explore how XRD, XRM, and EBSD solutions can be combined to unlock deeper insights into materials and processes critical to the battery industry.

What to expect?

Batteries are essential for modern technology, powering devices from smartphones to electric vehicles. Ensuring the quality and safety of batteries is crucial to prevent failures and hazards. Quality control throughout the batteries’ life cycle involves examining the anode, cathode, electrolyte, and separator materials, as well as materials to be recycled.

As a manufacturer of XRF, XRD, XRM and EBSD instruments, we aim to compare how these different analytical techniques can address various analytical questions about battery components:

  • XRD: Offers information about the average crystallographic structure and microstructure
  • EBSD: Delivers phase and crystallographic distribution down to the nanoscale, provides quantitative grain metrics, and helps correlate the microstructure with battery performance
  • 3D XRM / Micro-CT:  Non-destructive 3D vizualization of internal structures 

As extension from our previous webinar where we focused on the elemental characterization of battery components at different scales.

In this webinar, we will present results obtained with the different analytical techniques on battery precursor materials and various manufactured electrodes. We will explain the obtained results in terms of details resolution, sample volume/area, spatial resolution and measurement time, while also addressing general limitations that originate from the different physical principles behind the techniques. Understanding these differences helps in selecting the right method for specific analytical needs.

Presenter: Michele Gironda (Head of Global Segment Management, Bruker Nano Analytics)

Presenter: Hugues Guérault (Application Manager – Bruker Advanced X-Ray Solutions (Karlsruhe, Germany))

Presenter: Stephan le Roux (Application Scientist XRM, Bruker Belgium, Kontich, Belgium)

Presenter: Dr. Laurie Palasse (Global Application Manager, Bruker Electron Microscope Analyzers)

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LabRulez s.r.o. Všechna práva vyhrazena. Obsah dostupný pod licencí CC BY-SA 4.0 Uveďte původ-Zachovejte licenci.