Precision in High‑Temperature X‑Ray Diffraction: HTK1500 with XRDynamic500
High‑temperature in‑situ X‑ray diffraction (XRD) is essential for researchers and industrial users looking for a reliable insight into structural evolution, phase stability, and reaction mechanisms in advanced ceramic and energy materials. Yet, achieving accurate, reproducible results at extreme temperatures remains challenging with conventional non‑ambient solutions.
This webinar presents the Anton Paar HTK1500 non‑ambient chamber in combination with the XRDynamic500 diffractometer, delivering a next‑generation of instruments for precision high‑temperature XRD experiments (up to 1500 °C). Designed as a true environmental heater, the HTK1500 places the temperature sensor directly beneath the sample, ensuring outstanding accuracy and reproducibility exactly where diffraction occurs. Its design supports powders, thin films, bulk samples up to 20 mm height, and air‑sensitive materials.
Attendees will discover how automation, intuitive software integration, and optimized system compatibility with the XRDynamic500 translate into higher data quality, faster workflows, and greater experimental confidence. Application examples and competitive comparisons will demonstrate how the HTK-1500 sets a new benchmark in non-ambient chambers for productive, high‑temperature XRD measurements.
Key Learning Objectives:
- How to achieve reliable, high‑accuracy XRD measurements at extreme temperatures, ensuring confident interpretation of structural and phase changes.
- How a single, highly flexible non‑ambient system supports multiple sample types and geometries, including powders, thin films, bulk samples, and both reflection and transmission measurement modes.
- How the integration of the HTK1500 with the XRDynamic500 platform reduces setup time, user effort, and experimental complexity, enabling more efficient and reproducible workflows.
- Why Anton Paar’s HTK1500 is redefining the non‑ambient XRD market, building on Anton Paar’s long‑standing leadership in non‑ambient chambers to set a new benchmark in performance, usability, and data quality.
Presenter: Ivan Quevedo
Ivan Quevedo, PhD, is an Application Scientist in X-Ray Structure Characterization within the Material Characterization division at Anton Paar USA. As a member of the Advanced Technical Support Center, he specializes in theoretical and experimental material characterization. Ivan has over 10 years of experience as an academic researcher with 18 peer reviewed publications. He earned his PhD in Chemical Engineering from McGill University, a master’s in environmental engineering, and a bachelor’s in chemical engineering from Tec de Monterrey.
