Analysis of High Purity Titanium Using an Agilent 9500 ICP-QQQ

Accurate determination of trace metallic impurities in high purity titanium is essential for advanced materials applications, including semiconductor and aerospace manufacturing, where impurity levels directly influence performance and reliability. In this study, triple quadrupole Inductively Coupled Plasma Mass Spectrometry (ICP-QQQ) system equipped with a collision/reaction cell (CRC) was evaluated for the analysis of impurity elements in a high titanium matrix.

Presenter: Bert Woods (Application Scientist, Agilent Technologies, Inc.)

Joined the Agilent ICP-MS team in 2004, with previous employment in the semiconductor industry with Dominion Semiconductor (IBM/Toshiba) and Micron. Bert is a 1997 Chemistry graduate of Radford University in Virginia and an avid Washington DC Sports fan.