Jak kvalitní je svár nebo povrchová úprava mého nebo dodaného výrobku? Vznikl defekt chybným zacházením, nebo měl výrobek skrytou vadu materiálu? To jsou příklady otázek, které velmi rychle dokáže vyřešit tým univerzitního výzkumného ústavu CXI TUL. Pomoc při řešení konkrétních problémů ve výrobě, konzultace, analýzy a další služby špičkového vědeckého pracoviště za minimální náklady nabízí nyní firmám díky projektu SUPPORT4SME. Nabídka se týká malých a středních firem do 250 zaměstnanců z Libereckého, Ústeckého a Karlovarského kraje a také ze Saska.<h4>Podnik hradí pouze DPH</h4>„Řada menších firem má dobrý nápad nebo konkrétní technický problém, ale chybí jim přístup k potřebnému vybavení, expertům nebo laboratorním analýzám. Právě v tom jim může projekt SUPPORT4SME výrazně pomoci. Chceme, aby firmy věděly, že se na nás mohou obrátit i s velmi praktickými problémy z každodenní výroby nebo vývoje,“ říká řešitel projektu Adam Blažek z Ústavu pro nanomateriály, pokročilé technologie a inovace Technické univerzity v Liberci.&nbsp;Službu na míru si mohou firmy zadat na <a target="_blank" rel="noopener noreferrer" href="https://support4sme.cxi.tul.cz/">online platformě projektu</a>. Pokud splní podmínky programu, hradí pouze DPH z reálné ceny služby. Investice do výzkumu tak pro malé a střední podniky přestává být významnou finanční překážkou.<h4>Analýza jako opora pro soudní spor</h4>Podporu projektu využila například stavební firma Tembo brand, která řešila prasklou hřídel čelního kloubového nakladače. Potřebovala zjistit, zda je příčinou chyba obsluhy, nebo vada samotného výrobku. Obrátila se proto na CXI.Detailní analýzy potvrdily výrobní vadu materiálu a staly se součástí oficiálního znaleckého posudku pro soudní řízení. Pro podobné případy má univerzita k dispozici elektronový mikroskop Helios 5 PFIB CXe, který umožňuje velmi podrobně zkoumat kvalitu materiálů, povrchové úpravy, slitiny, svary i další defekty. Mikroskop za více jak 45 milionů korun je unikátní tím, že vědci s ním mohou provádět i mikroskopické „řezy“ do zkoumaného materiálu a díky celé škále detektorů provádět komplexní fyzikální i chemickou analýzu složení vzorku.Firmě odborná analýza přinesla nejen vysvětlení příčiny problému, ale také silný podklad pro reklamaci a další právní kroky. „Buď bych tento stroj musel finančně náročně opravit, nebo bych s ním jezdil dál, což by pochopitelně představovalo bezpečnostní riziko nejen pro mě. Reklamaci teď máme prokázanou, dodavatel nám dodal zmetek a zřejmě se budeme soudit,“ popisuje Jakub Ševčík z firmy Tembo brand.<blockquote>Video: <a target="_blank" rel="noopener noreferrer" href="https://www.youtube.com/watch?v=f5WXnKT2_tE&amp;t=2s">Špičkový mikroskop Helios pomáhá malým a středním firmám&nbsp;</a></blockquote><h4>Pomoc při vývoji běžkařských vosků</h4>Projekt SUPPORT4SME pomohl také firmě Titan Gliders, která na TUL našla odborné zázemí pro vývoj běžkařských vosků. Pomocí moderních analytických metod vědci zkoumají vlastní syntetizované přísady i konkurenční komerční vosky, a firma tak získává důležitá data pro další vývoj.&nbsp;„Spolupráce s CXI TUL se nám vyplatila jednoznačně. Víme přesně, kam napřít síly, bez takového zázemí bychom se jen těžko obešli. Navíc jsme díky tomu získali podporu českého biatlonu, Českého olympijského výboru i Libereckého kraje. Pro firmu, která začínala od nuly a byla financována z vlastních zdrojů, to má zásadní význam,“ říká Petr Tischer ze společnosti Titan Gliders.&nbsp;<h4>Pomoc, která firmám šetří peníze</h4>Projekt SUPPORT4SME nabízí tyto služby a množství dalších, také konzultace odbornic a odborníků, kteří disponují špičkovým laboratorním vybavením, a pomoc při řešení konkrétních technologických a materiálových problémů. Za cíl si klade podpořit v česko-saském regionu více než 130 podniků, zatím tyto služby využilo necelých třicet podniků.„Nejde jen o podporu velkých inovačních projektů. Často stačí vyřešit jeden konkrétní problém, ověřit vlastnosti materiálu nebo získat odborný pohled na technologický postup. I taková pomoc může firmě ušetřit čas, peníze a otevřít cestu k dalšímu rozvoji. Zástupci firem mnohdy ani netuší, že tu jsme a s&nbsp;čím vším jim můžeme pomoci. Přitom u nás mají k&nbsp;dispozici nejnovější přístrojové vybavení za naprosto zanedbatelné ceny. Ať firmy neváhají a obrátí se na nás s&nbsp;konkrétními dotazy, které je trápí nebo zajímají, “ uzavírá Adam Blažek.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CXI_TUL_Firmy_mohou_ziskat_pomoc_spickovych_odborniku_z_TUL_za_hubicku_5ceaee370e.jpg" alt="CXI TUL: Firmy mohou získat pomoc špičkových odborníků z TUL „za hubičku“" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CXI_TUL_Firmy_mohou_ziskat_pomoc_spickovych_odborniku_z_TUL_za_hubicku_5ceaee370e.jpg 234w," sizes="100vw" width="1024" height="683"><h3>SUPPORT4SME</h3>Projekt propojuje malé a střední podniky z Libereckého, Ústeckého a Karlovarského kraje a ze Saska s aplikovaným výzkumem. Technická univerzita v Liberci jej realizuje ve spolupráci s Technickou univerzitou v Chemnitz v rámci programu Interreg Česko–Sasko 2021–2027. Firmy díky němu mohou využít odborné služby aplikovaného výzkumu, individuální konzultace a analýzy i workshopy a školení. Projekt jim otevírá přístup k mezioborové síti expertů a špičkovému výzkumnému zázemí, které mohou využít při zavádění inovací do praxe.<blockquote>Support4sme: Přeshraniční podpora zapojení malých a středních podniků do materiálového výzkumu budoucnosti.Cíl: Společné centrum přeshraniční spolupráce TU Liberec a TU Chemnitz podporuje a implementuje inovace do malých a středních podniků v regionu Česko – Sasko. SUPPORT4SME nabízí mezioborovou síť expertů, kteří vám pomohou s rozvojem vaší firmy.Finanční podpora EU (EFRR): 2.442.017,81 €Leadpartner: CXI TULPartner: Technická univerzita v&nbsp;ChemnitzMgr. Adam Blažek, MBA – řešitel <a href="mailto:adam.blazek@tul.cz">adam.blazek@tul.cz</a> +420 730 595&nbsp;011</blockquote><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CXI_TUL_Firmy_mohou_ziskat_pomoc_spickovych_odborniku_z_TUL_za_hubicku_2_6cbc5d3425.jpg" alt="CXI TUL: Firmy mohou získat pomoc špičkových odborníků z TUL „za hubičku“" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CXI_TUL_Firmy_mohou_ziskat_pomoc_spickovych_odborniku_z_TUL_za_hubicku_2_6cbc5d3425.jpg 234w," sizes="100vw" width="1024" height="683">

Firmy mohou získat pomoc špičkových odborníků z TUL „za hubičku“

V týdnu od 11. května na Vás čekají v oblasti atomové a molekulové spektroskopie a spektrometrie následující webináře.<blockquote><h4><a target="_blank" rel="noopener noreferrer" href="https://www.icpms.cz/webinars">👉 DETAILY A REGISTRACE V SEKCI WEBINÁŘE</a></h4>👉 Vyhledávejte a filtrujte v největší globální databázi s více než 5 500 GC, HPLC, MS a spektroskopickými webináři.</blockquote><h5>1. Thermo Fisher Scientific: Uncovering Microplastics: Identification, Quantification, and Exposure Assessment</h5><ul><li>Út, 12.5.2026 08:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.cz/webinar/6136">Registrace</a></li></ul>Komplexní analytická řešení pro identifikaci, kvantifikaci a hodnocení expozice mikroplastům pomocí doplňkových technik.<h5>2. SPECTRO Analytical Instruments: Elemental Analysis of Superalloys: Ensuring Performance in Extreme Applications</h5><ul><li>Út, 12.5.2026 10:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.cz/webinar/6170">Registrace</a></li></ul>Zjistěte, jak OES a XRF podporují přesnou elementární analýzu superslitin pro kontrolu kvality v náročných průmyslových aplikacích.<h5>3. Agilent Technologies: What have you been smoking? Elemental Analysis in Cannabis and Cannabis Products with ICP-MS</h5><ul><li>Út, 12.5.2026 20:30 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.cz/webinar/6063">Registrace</a></li></ul>ICP-MS workflow pro elementární analýzu konopí a konopných produktů s automatizovanou kalibrací a ředěním vzorků.<h5>4. AZoM: Faster REE Exploration Decisions with XRF Technology Explained</h5><ul><li>St, 13.5.2026 16:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.cz/webinar/6195">Registrace</a></li></ul>Výhody ruční XRF technologie pro rychlé rozhodování při průzkumu prvků vzácných zemin (REE).<h5>5. Bruker: Advancing Industrial Metrology Automation with Bruker's Dimension AFMs</h5><ul><li>St, 13.5.2026 17:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.cz/webinar/6172">Registrace</a></li></ul>Jak platformy Dimension AFM podporují automatizaci průmyslové metrologie – od skriptovaných měření po řízení založené na datech.<h5>6. Anton Paar: Polymer Rheology: Impact of Humidity on Material Behavior</h5><ul><li>St, 13.5.2026 18:00 CET</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.cz/webinar/5801">Registrace</a></li></ul>Praktické studie vlivu vlhkosti na reologii polymerů, lepivost, vytvrzování a tokové vlastnosti materiálů.<h5>7. LECO: TOC Determination in Soil and Waste</h5><ul><li>Čt, 14.5.2026 14:00 CEST</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.cz/webinar/6038">Registrace</a></li></ul>Moderní přístupy ke stanovení TOC v půdách a odpadech pro environmentální a průmyslové aplikace.

Webináře LabRulezICPMS týden 20/2026

<h3>Plně v souladu s normami ASTM: Viskozita, hustota a bod tuhnutí</h3><h4>Sedm kritických testů tryskového paliva v jedné automatizované jednotce</h4>Přístroj Anton Paar SVM 3001 Cold Properties je nyní standardizován dle normy ASTM pro bod tuhnutí (D8630), což umožňuje shodné měření viskozity, hustoty a bodu tuhnutí pomocí jednoho přístroje.Viskozita se měří podle normy ASTM D7042, hustota podle normy ASTM D4052 a bod tuhnutí podle normy ASTM D8630. Systém také podporuje požadavky na viskozitu -20 °C a -40 °C podle norem ASTM D1655, D7566 a DefStan 91-091.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Anton_Paar_SVM_3001_Cold_Properties_d1259ab21f.jpg" alt="Anton Paar: SVM 3001 Cold Properties" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Anton_Paar_SVM_3001_Cold_Properties_d1259ab21f.jpg 234w," sizes="100vw" width="2400" height="1600">Kromě těchto základních parametrů určuje SVM 3001 Cold Properties další kritické vlastnosti paliva – jako je teplota při 12 mm²/s (nebo jakákoli specifikovaná kinematická nebo dynamická viskozita) a viskozita 3 °C nad bodem tuhnutí – z jediného vzorku.Skenování teploty poskytuje skutečnou charakterizaci čerpatelnosti v celém relevantním rozsahu nízkých teplot, zatímco integrovaná Peltierova regulace teploty eliminuje potřebu kapalných lázní. Celkem lze v jednom plně automatizovaném měření získat sedm klíčových vlastností leteckého paliva. Ve srovnání s tradičními metodami SVM snižuje čas, objem vzorku a úsilí – poskytuje automatizovanou a sledovatelnou certifikaci konvenčního leteckého paliva a SAF v jednom pracovním postupu.<blockquote><h5>Kontaktujte nás a domluvite si osobní schůzku</h5>CZ: Ing. Veronika Mrňová: veronika.mrnova@anton-paar.comSK: Ing. Pavol Frič: pavol.fric@anton-paar.com</blockquote>

Jeden přístroj: Sedm kritických vlastností tryskového paliva

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Vše ze světa analytické chemie na jednom místě. Propojujeme lidi při řešení jejich problémů. U nás naleznete všechny potřebné informace snadno, rychle a přehledně. Přestaňte hledat a začněte nacházet.

LabRulez

Ústav pro nanomateriály, pokročilé technologie a inovace Technické univerzity v Liberci, známý také jako CXI TUL, byl založen v roce 2009. Naším posláním je podporovat dlouhodobou vizi TUL v oblasti spolupráce s průmyslem a vytváření inovací.

CXI TUL

Anton Paar vyvíjí, vyrábí a distribuuje vysoce přesné laboratorní přístroje a procesní měřicí systémy a nabízí uživatelsky specifická řešení automatizace a robotizace.

Anton Paar

Agilent Technologies

Thermo Fisher Scientific

Learn how to transform your unknown samples into routine analyses. Utilizing ICP-Expert’s Smart features, any analyst can easily develop a method that offers greater sample insight than ever before – leading to better results.
Join us to see how you can become a more savvy ICP-OES analyst.
<blockquote>
Presenter: Ana García-González (Atomic Spectroscopy Application Scientist, Agilent Technologies)
</blockquote>
<blockquote>
Ana Garcia is the Atomic Spectroscopy Application Scientist at Agilent Technologies. Ana has a broad background in atomic spectroscopy technologies, including international experience developing and validating analytical spectroscopy methods for the geochemical industry. She has also published in the fields of molecular spectroscopy and chemometrics. Ana holds a MSc in plant Biotechnology at CINVESTAV, México, and a Bachelor of Science in Biotechnology Engineering.
</blockquote>
<blockquote>
Presenter: Chris Conklin (Atomic Spectroscopy Product Specialist, Agilent Technologies, Inc.)
</blockquote>
<blockquote>
With a degree from the University of Wisconsin – Eau Claire, Chris worked in, and lead, a quality control lab testing fine chemicals ranging from reagent grade to high purity. Over the course of 12 years in that role, Chris has run a variety of atomic elemental instruments and techniques including AA, ICP-OES, and ICP-MS. As a result, he has seen most of the periodic table in its elemental form and overcome the associated interferences. In 2018, Chris brought that knowledge and experience to his current role with Agilent as the Product Specialist for Atomic Spectroscopy supporting AA, MP-AES, and ICP-OES for the Eastern US.
</blockquote>

Agilent Technologies: Tips and Tricks Workshop on ICP-OES: Smarter Method Development

Tips and Tricks Workshop on ICP-OES: Smarter Method Development

Learn how to transform your unknown samples into routine analyses.

Tips and Tricks Workshop on ICP-OES: Method Development

This seminar will focus on high throughput ICP analysis using an Agilent 5900 SVDV and an AVS flow injection valve.
The SVDV option allows the user to run both axial and radial analyses at the same time, saving up to 30 seconds per analysis. The AVS option basically takes that analysis time and reduces it by half. Soil and Petrochemical high throughput analysis will be featured with soils at 9-12 seconds sample to sample and oils from 17 – 30 seconds sample to sample.
<blockquote>
Presenter: Paul Krampitz (Application Scientist, Agilent Technologies, Inc.)
</blockquote>
<blockquote>
Graduate of Bowling Green State University with a Chemistry Bachelor of Science degree. Twenty – five years of Spectroscopy experience mainly Inductively Coupled Plasma (ICP) Spectroscopy as well as ICP-MS and AAS. Experience also includes X-Ray Fluorescence (ED, WD), Laser Ablation, Inorganic Speciation and Microwave Plasma Spectroscopy. Market Segment expertise includes environmental, petrochemical, metallurgical applications.
</blockquote>

Agilent Technologies: Got a Second(s)? How to save precious time in ICP Analysis – High Throughput analysis from Oils to Soils

Got a Second(s)? How to save precious time in ICP Analysis – High Throughput analysis from Oils to Soils

This seminar will focus on high throughput ICP analysis using an Agilent 5900 SVDV and an AVS flow injection valve.

ICP Analysis – High Throughput analysis from Oils to Soils

In this first part of our two-part educational webinar, we will take you through the main considerations of sample prep and sample introduction techniques.
We will also discuss plasma effect and instrumentation maintenance. 
This session “From sample prep to data evaluation using ICP-OES and ICP-MS” will cover:
<ul>
<li>Sample Prep – creating serial dilutions from stock standards
</li>
<li>Sample introduction options and considerations – matrix matching, physical and chemical interferences
</li>
<li>Inductively Coupled Plasma – RF, plasma effects
</li>
<li>ICP-OES and ICP-MS cleaning and maintenance
</li>
<li>ICP-OES and ICP-MS theory of operation
</li>
</ul>
Learning points:
<ul>
<li>Learn theoretical and practical fundamentals for daily operation with ICP-OES and ICP-MS
</li>
<li>Learn about sample preparation, sample introduction and plasma settings to integrate and optimize this technology in your routine analysis
</li>
<li>Learn tips and trick for cleaning and maintenance to improve your analytical performance
</li>
</ul>
Who should attend:
<ul>
<li>Laboratory managers and analysts who work with ICP-OES and ICP-MS systems
</li>
<li>Analysts who want to learn about sample prep, sample introduction and instrument maintenance
</li>
<li>Laboratory leaders who want to leverage the full potential of their instrument
</li>
</ul>
<blockquote>
Presenter: Matthew Gregory (Specialist, Sales Support, TEA &amp; DIA, UK &amp; Ireland, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating from the University of Surrey with an MChem in Chemistry, Matthew has gained 15 years’ experience of trace elemental analysis in industry, working in environmental and precious metal research laboratories. In 2018 Matthew joined Thermo Fisher Scientific as an Applications Specialist for the Trace Elemental Analysis product range in the UK and Ireland.
</blockquote>
<blockquote>
Presenter: Niel Williams (Specialist, Sales Support, TEA &amp; DIA, UK &amp; Ireland, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating in 2014, Niel first joined Teledyne Advanced Chemistry systems as an applications specialist and later technical sales specialist. In 2019, he took the role of applications specialist for the Trace Elemental Analysis product range in the UK and Ireland at Thermo Fisher Scientific. Niel holds a BSc in Geology and Planetary science and a PhD in Isotope Geochemistry from the University of Manchester.
</blockquote>

Thermo Scientific: Introduction to ICP spectrometry: Part 1

Introduction to ICP spectrometry: Part 1

The main considerations of sample prep and sample introduction techniques.

In our second part of this educational webinar, we will show you various tips and tricks for performance optimization, method development and data handling.
The session &quot;From sample prep to data evaluation using ICP-OES and ICP-MS&quot; will cover: 
<ul>
<li>System Optimization – Performance reports, Mass Cal/Cross Cal, KED interface cleaning, Conditioning
</li>
<li>Method development – Correct wavelength/viewing mode and isotope selection, interferences – spectral and m/z, determine correct internal standards to use and validation of method
</li>
<li>Data evaluation – correcting for background and interferences, stability, and sensitivity verification, Examine calibration curves for R2, LOD and saturation, QC data, carryover and drift correction
</li>
</ul>
Learning points:
<ul>
<li>Learn theoretical and practical fundamentals for daily operation with ICP-OES and ICP-MS
</li>
<li>Learn about system optimization, method development and data evaluation to integrate and optimize this technology in your routine analysis
</li>
<li>Learn tips and trick for cleaning and maintenance to improve your analytical performance
</li>
</ul>
Who should attend:
<ul>
<li>Laboratory managers and analysts who work with ICP-OES and ICP-MS systems
</li>
<li>Analysts who want to learn about sample prep, sample introduction and instrument maintenance
</li>
<li>Laboratory leaders who want to leverage the full potential of their instrument
</li>
</ul>
<blockquote>
Presenter: Niel Williams (Specialist, Sales Support, TEA &amp; DIA, UK &amp; Ireland, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating in 2014, Niel first joined Teledyne Advanced Chemistry systems as an applications specialist and later technical sales specialist. In 2019, he took the role of applications specialist for the Trace Elemental Analysis product range in the UK and Ireland at Thermo Fisher Scientific. Niel holds a BSc in Geology and Planetary science and a PhD in Isotope Geochemistry from the University of Manchester.
</blockquote>
<blockquote>
Presenter: Matthew Gregory (Specialist, Sales Support, TEA &amp; DIA, UK &amp; Ireland, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating from the University of Surrey with an MChem in Chemistry, Matthew has gained 15 years’ experience of trace elemental analysis in industry, working in environmental and precious metal research laboratories. In 2018 Matthew joined Thermo Fisher Scientific as an Applications Specialist for the Trace Elemental Analysis product range in the UK and Ireland.
</blockquote>

Thermo Scientific: Introduction to ICP spectrometry: Part 2

Introduction to ICP spectrometry: Part 2

Various tips and tricks for performance optimization, method development and data handling.

Extracting the full potential of trace elemental analysis instrumentation to meet regulatory, compliance and performance requirements: Part 1 ICP-OES
Join this virtual demonstration of the Thermo Scientific iCAP PRO Series ICP-OES to learn how to easily meet and surpass regulatory requirements for your trace elemental analysis. In this online seminar we will focus on three key markets and demonstrate how the hardware and software of the iCAP PRO enhance performance and simplify your analysis.
The three markets covered are: 
Environmental – Discover how enhanced detector capabilities and optical design allow class leading detection limits and speed of analysis to be achieved. Comprehensive quality control features within the software simplify data validation. 
Precious metals – With its new vertical torch design and higher resolution camera, better robustness and signal stability are obtained with the iCAP PRO. Automated interelement interference workflows with customizable limits add enhanced accuracy and flexibility for your analysis. 
Wear metals and lubricants – Improved system robustness and speed of analysis enable longer run times between maintenance for oil-based samples. 
This online seminar will conclude with a short panel discussion around the new regulations within each market and how the instrument hardware and software features future-proof your laboratory. 
Learning points:
<ul>
<li>Discover how the new hardware of the iCAP PRO provides you with class leading performance.
</li>
<li>Learn about modern software tools to integrate this technology into your routine analysis and simplify compliance with market regulations.
</li>
<li>Find out how instruments from Thermo Fisher Scientific future-proof your lab, preparing you for stricter regulations with ever decreasing limits of detection, higher accuracy and better stability requirements.
</li>
</ul>
Who should attend? 
<ul>
<li>Laboratory managers and analysts who work with ICP-OES systems. 
</li>
<li>Analysts who want to learn about the latest technology. 
</li>
<li>Laboratory leaders who want to leverage the full potential of their instrument.
</li>
</ul>
<blockquote>
Presenter: Matthew Gregory (Specialist, Sales Support, TEA &amp; DIA, UK &amp; Ireland, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating from the University of Surrey with an MChem in Chemistry, Matthew has gained 15 years experience of trace elemental analysis in industry, working in environmental and precious metal research laboratories. In 2018 Matthew joined Thermo Fisher Scientific as an Applications Specialist for the Trace Elemental Analysis product range in the UK and Ireland.
</blockquote>
<blockquote>
Presenter: Niel Williams (Specialist, Sales Support, TEA &amp; DIA, UK &amp; Ireland, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating in 2014, Niel first joined Teledyne Advanced Chemistry systems as an applications specialist and later technical sales specialist. In 2019, he took the role of applications specialist for the Trace Elemental Analysis product range in the UK and Ireland at Thermo Fisher Scientific. Niel holds a BSc in Geology and Planetary science and a PhD in Isotope Geochemistry from the University of Manchester.
</blockquote>
<blockquote>
Presenter: Simon Nelms (Product Marketing Manager TEA, Thermo Fisher Scientific)
</blockquote>
<blockquote>
Simon joined Thermo Fisher Scientific in 1996 as an applications specialist for ICP-MS, before taking a 2-year postdoctoral sabbatical at IRMM in Belgium. He re-joined the company in 2000 and in 2014 moved into Regional Marketing for the EMEA area. Simon has recently joined the Product Marketing team, covering trace elemental analysis accessories and software.
</blockquote>

Thermo Scientific: ICP-OES Educational Webinar

ICP-OES Educational Webinar

How to easily meet and surpass regulatory requirements for your trace elemental analysis.

In this two-part webinar series, the sources of interferences in ICP-OES and ICP-MS and how to identify them will be described.
Software approaches for correcting interfered results which each technique will be presented and the latest instrumental developments for minimizing interference problems will also be discussed.
Interferences are a well-known problem in both inductively coupled plasma–optical emission spectroscopy (ICP-OES) and ICP–mass spectrometry (ICP-MS). They can be subdivided into three main types: chemical, physical, and spectral.
<ul>
<li>Chemical interferences are caused by differences in the way sample and calibration solution matrices behave in the plasma, resulting in changes in atomization and ionization that are dependent on the matrix composition of the sample. An example of this type of interference is the enhancement effect (which causes falsely high results) observed on both atom and ion signals for elements such as arsenic and selenium, when carbon is present in the samples but not the calibration solutions.
</li>
<li>Physical interferences are also caused by matrix differences between samples and calibration solutions. Examples of this type of interference include signal suppression (due to high amounts of easily ionized elements, such as sodium, in the samples), drift and signal variability from sample to sample caused by, for example, changes in nebulization efficiency as a result of viscosity differences between samples. These interferences can cause reported results to be either too high or too low if they are not properly corrected for.
</li>
<li>The last, and most challenging, type of interference is spectral interference. For ICP-OES, these are observed as either direct or partial emission wavelength overlaps on the signals of target analytes from other elements or molecular species in the sample. For ICP-MS, spectral interferences from other elements in the sample appear as either direct (from singly charged ions) or half-mass (from doubly charged ions) overlaps on the target ion isotope signals. With ICP-OES, spectral interferences, like physical interferences, can cause falsely high or falsely low results. With ICP-MS, the overlaps caused by interfering signals generate false positive signals, but if incorrect mathematical corrections are applied to the data, falsely low results can also be reported.
</li>
</ul>
Key learning objectives
<ul>
<li>Understand what types of interferences exist in ICP-OES and ICP-MS and how they affect your results.
</li>
<li>Learn strategies for identifying and managing these interferences.
</li>
<li>Find out how innovations in hardware help reduce interferences, improve accuracy, and remove the need to re-run samples.
</li>
<li>Discover how intelligent software tools enable easier, interference-free method development.
</li>
</ul>
Part 1
<blockquote>
Presenter: Matthew Cassap (Product Marketing Manager (AAS and ICP-OES) Thermo Fisher Scientific)
</blockquote>
<blockquote>
Presenter: Dr. Sukanya Sengupta (Application Specialist Trace Elemental Analysis Thermo Fisher Scientific)
</blockquote>
Part 2
<blockquote>
Presenter: Dr. Daniel Kutscher (Product Marketing Specialist Thermo Fisher Scientific)
</blockquote>
<blockquote>
Presenter: Dr. Simon Nelms (Product Marketing Manager Thermo Fisher Scientific)
</blockquote>

Thermo Scientific: ICP-OES and ICP-MS Interferences explained

ICP-OES and ICP-MS Interferences explained

The sources of interferences in ICP-OES and ICP-MS and how to identify them.

The analysis of elemental contaminants and impurities, especially toxic metals, is typically done in the inorganic analysis laboratory, operating inductively coupled plasma–optical emission (ICP-OES) or mass spectrometry (ICP-MS) instruments.
Although sample preparation and the elimination of interferences are often the most obvious challenges, the role of software is often underestimated when considering opportunities to improve the overall performance of the laboratory. Important challenges are often related to effective operator cross-training between different instruments, batch setup, data evaluation and compliance with data security regulations like 21 CFR Part 11/EU Annex 11. The Thermo Scientific Qtegra Intelligent Scientific Data Solution™ is an instrument agnostic software platform controlling a wide range of instruments, such as ICP-OES, ICP-MS and MC-ICP-MS. With its user centric architecture and range of plug-ins, it brings together a wide range of hardware accessories and applications into a well-structured workflow.
This webinar will highlight the key role that software plays in a modern and integrated laboratory for elemental analysis. Attend and learn how the challenges can be easily overcome.
Key learning objectives
<ul>
<li>Discover how cross-platform software can help you be more efficient in the modern inorganic laboratory
</li>
<li>See how compliance can be easily achieved without requiring any additional software
</li>
<li>Understand how software can leverage the full potential of your instrument
</li>
<li>Learn how data visualization can help you to streamline processes and deliver results faster
</li>
</ul>
Who should register
<ul>
<li>Analysts operating multiple instruments for the analysis of trace elements
</li>
<li>Operators handling large sets of data and expected to deliver results quickly
</li>
<li>Lab leaders in search of new solutions for efficiency and compliance
</li>
</ul>
<blockquote>
Presenter: Dr. Daniel Kutscher (Product Marketing Specialist, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating with a degree in chemistry in 2007, Dr. Daniel Kutscher obtained his PhD from the University of Oviedo in 2011. In the same year he joined Thermo Fisher Scientific in his role as Application Specialist for ICP-MS and joined the Marketing team in 2018.
</blockquote>
<blockquote>
Presenter: Julian Wills (Software and Accessories Product Manager, Thermo Fisher Scientific)
</blockquote>
<blockquote>
Julian Wills applies his ICP-MS experience in the development of innovative software solutions from Thermo Scientific as well as in collaboration with its partners in trace elemental analysis.
</blockquote>

Thermo Scientific: Streamlining Your Elemental Analysis Workflow Using Innovative Software Tools

Streamlining Your Elemental Analysis Workflow Using Innovative Software Tools

Key role that software plays in a modern and integrated laboratory for elemental analysis.

Streamlining Your Elemental Analysis Workflow

Producing wells, gas, and oil need some treatment and characterization before they can move by pipeline, rail, and tanker truck.
Midstream has the vital role of moving raw hydrocarbons to refining and processing. Various regulations, safety considerations, corrosion, and fouling all require critical tests to keep the flow moving. This presentation will cover the broad range of solutions offered by Thermo Fisher Scientific, such as combustion IC, gas chromatography, ion chromatography, ICP-OES, and more. All are designed and implemented to provide reliable, repeatable, automated results.
<blockquote>
Presenter: James Pachlhofer (Implementation Specialist, Thermo Fisher Scientific)
</blockquote>
<blockquote>
With over 40 years’ experience in analytical instrumentation, James is a true veteran! His role at Thermo Fisher Scientific is to ensure the solution sold for an oil, gas, or petrochemical application performs perfectly to the customer&#39;s satisfaction. He is a native of Houston, the home of oil and gas, with a B.S. in Biochemistry from the University of Houston.
</blockquote>

Thermo Scientific: Moving Crude and Gas from Well to Plants - Solutions for Common Problems and Challenges in the Future for the Midstream

Moving Crude and Gas from Well to Plants - Solutions for Common Problems and Challenges in the Future for the Midstream

Solutions offered by Thermo Fisher Scientific, such as combustion IC, gas chromatography, ion chromatography, ICP-OES, and more.

Moving Crude and Gas from Well to Plants

Inorganic species, metals, gases, and organometallics play an important role in the research and analytical lab.
Learn how ICP-OES, ICP-MS, and ICP-MS/MS can help protect expensive catalysts, prevent process fouling or off-spec product, and meet environmental regulations.
<blockquote>
Presenter: Daniel Kutscher (Product Marketing Specialist, Thermo Fisher Scientific)
</blockquote>
<blockquote>
After graduating with a degree in Chemistry in 2007, Daniel obtained his Ph.D. from the University of Oviedo (Spain) in 2011. In the same year, he joined Thermo Fisher Scientific as an Application Specialist for ICP-MS and joined the marketing team in 2018.
</blockquote>

Thermo Scientific: It's ELEMENTary - Managing Challenges in Inorganic Analysis

It's ELEMENTary - Managing Challenges in Inorganic Analysis

Learn how ICP-OES, ICP-MS, and ICP-MS/MS can help protect expensive catalysts, prevent process fouling or off-spec product, and meet environmental regulations.

It's ELEMENTary - Managing Challenges

In the drive towards reducing dependence on burning fossil fuels for energy generation, several technologies have become established as front runners in the race to reduce carbon emissions and improve air quality.
One of the most significant is lithium ion battery technology and a rapid ramp up in production of these batteries is currently underway globally. As a result, a corresponding increase in analytical testing of the battery component materials has arisen.
Elemental analysis techniques such as ICP-OES and ICP-MS are vital for both research and quality control analysis of cathode, electrolyte and anode materials. This presentation gives a complete overview of how ICP-OES and ICP-MS analysis supports every step in the battery manufacturing value chain, from raw material screening and refining, through battery cell material research and QA/AC, to recycling and environmental analysis.
The presentation covers the following topics:
<ul>
<li>Introduction to ICP-OES and ICP-MS and what these techniques provide for battery material analysis
</li>
<li>Discussion of specific analysis examples, including bulk composition and impurity measurement of cathode active materials and electrolytes and determination of trace elements in anode materials
</li>
</ul>
By viewing this presentation, you will learn:
<ul>
<li>The basics of ICP-OES and ICP-MS technology
</li>
<li>How these technologies support battery material analysis, from raw materials to recycling
</li>
<li>What performance they achieve, demonstrated with selected analysis examples
</li>
</ul>
Who should view this presentation?
<ul>
<li>Battery material analysis laboratory managers and analysts
</li>
<li>Battery cell manufacturers and their QA/QA personnel
</li>
<li>Recycling specialists, particularly those working with battery metals such as Li, Ni, Mn, Fe and Co
</li>
<li>Scientists working in battery research and development
</li>
<li>Environmental monitoring laboratory managers
</li>
</ul>
<blockquote>
Presenter: Simon Nelms (ICP-MS Product Marketing Manager, Thermo Fisher Scientific)
</blockquote>
<blockquote>
Presenter: Sukanya Sengupta (Application Specialist Trace Elemental Analysis, Thermo Fisher Scientific)
</blockquote>

Thermo Scientific: Powering Up Battery Materials Analysis using ICP-OES and ICP-MS

Powering Up Battery Materials Analysis using ICP-OES and ICP-MS

How ICP-OES and ICP-MS analysis supports every step in the battery manufacturing value chain.

ICPMS webináře se zaměřením na ICP/OES - strana 17