Superior ICP-OES optical design for unmatched speed and performance
Technické články | 2014 | Agilent Technologies Instrumentace
ICP/OES
VýrobceAgilent Technologies
Klíčová slovaechelle, blooming, vistachip, optics, oes, pixels, diffraction, icp, polychromator, readout, dlas, simultaneous, ait, design, optical, circuitry, wavelength, anti, detector, adaptive, emission, measurement, integration, orders, fewer, entranceslit, image, vary, identifiable, dla, each, grew, need, technology, depending, hermetically, photosensitive, elements, superior, accurately, match, superimposed, state, every, unrivalled, produced, complemented, nearby, barriers, arrays
Podobná PDF
True simultaneous ICP-OES for unmatched speed and performance
2012|Agilent Technologies|Technické články
True simultaneous ICP-OES forunmatched speed and performanceTechnical overviewIntroductionThe Agilent 700 Series ICP-OES spectrometers combine state-of-the-artechelle optical design with innovative CCD detector technology. Leadingthe way, the 720 Series incorporate Image Mapping (I-MAP) and AdaptiveIntegration Technology (AIT). This combination provides unique, truesimultaneous...
Klíčová slova
echelle, echelleoes, oesblooming, bloomingvistachip, vistachippixels, pixelsdiffraction, diffractionicp, icpait, aitsimultaneous, simultaneouscircuitry, circuitrypolychromator, polychromatorreadout, readoutoptics, opticsdlas, dlasoptical
CCD and CID solid-state detectorsTechnical overviewIntroductionMany of today’s ICP-OES instruments have progressed from traditionalphotomultiplier tube (PMT) detection systems to solid-state charge transferdevices including the charge-coupled device (CCD) and charge injectiondevice (CID). The role of the detector has not changed in...
Klíčová slova
pixels, pixelscids, cidsccd, ccdpixel, pixelblooming, bloomingccds, ccdsvistachip, vistachipintegration, integrationcharge, chargewavelengths, wavelengthsadaptive, adaptiveoffer, offeroes, oesdetector, detectorcid
Superior ICP-OES optical design for unmatched speed and performance
2016|Agilent Technologies|Technické články
Superior ICP-OES optical design forunmatched speed and performanceTechnical Overview5110 ICP-OESIntroductionThe Agilent 5110 ICP-OES combines a vertical torch, unique dual view andsynchronous dual view pre-optics, and state-of-the-art echelle optical designwith innovative CCD detector technology. The efficient and highly optimizedoptical design in...
Klíčová slova
echelle, echelleblooming, bloomingvistachip, vistachipoptics, opticsoes, oespixels, pixelsdiffraction, diffractionicp, icppolychromator, polychromatorreadout, readoutdlas, dlassimultaneous, simultaneousait, aitdesign, designoptical
CCD and CID solid-state detectorsTechnical Overview5110 ICP-OESIntroductionMany of today’s ICP-OES instruments have progressed from traditionalphotomultiplier tube (PMT) detection systems to solid-state charge transferdevices including the charge-coupled device (CCD) and charge injectiondevice (CID). The role of the detector has not changed...
Klíčová slova
pixels, pixelsccd, ccdcids, cidscircuitry, circuitryblooming, bloomingccds, ccdswavelengths, wavelengthspixel, pixelvistachip, vistachipreadout, readoutoes, oesadaptive, adaptiveintegration, integrationicp, icpdetector