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WCPS: Nanoparticle Analysis in Cosmetic Samples by Multi-element Screening Function of spICP-MS

 

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Measurement of nanoparticle components in sunscreens by multi-element screening function of spICP-MS Michiko Yamanaka1*, Takayuki Itagaki1, Steve Wilbur2 APWC2017 1. Agilent Technologies International Japan, Ltd C-02 2. Agilent Technologies Inc. Results and Discussion Time (s) Sunscreen B Time (s) Count…
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Application Note Environmental, food, cosmetics, materials Measuring Multiple Elements in Nanoparticles using spICP-MS Acquire NP data for up to 16 elements in Rapid Multi-Element Nanoparticle Analysis Mode Authors Michiko Yamanaka, Takayuki Itagaki Agilent Technologies, Japan Steve Wilbur Agilent Technologies, USA…
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Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…
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Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…
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LabRulez s.r.o. Všechna práva vyhrazena. Obsah dostupný pod licencí CC BY-SA 4.0 Uveďte původ-Zachovejte licenci.