Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ
Aplikace | 2019 | Agilent Technologies Instrumentace
ICP/MS, ICP/MS/MS
ZaměřeníPolovodiče
VýrobceAgilent Technologies
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5th EditionHandbook of ICP-QQQApplications using theAgilent 8800 and 8900Primer > Return to table of contents> Search entire documentForewordAgilent Technologies launched its 8800 Triple QuadrupoleICP-MS (ICP-QQQ) at the 2012 Winter Conference on PlasmaSpectrochemistry in Tucson, Arizona, USA.By the time the first ICP-QQQ...
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Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS
2022|Agilent Technologies|Aplikace
Application NoteSemiconductorElemental and Particle Analysis ofN-Methyl-2-Pyrrolidone (NMP) byICP-MS/MSAnalysis of dissolved and particulate inorganicimpurities in two grades of NMP using the Agilent8900 ICP-QQQAuthorIntroductionYoshinori ShimamuraIdeally, analytical quality control (QC) testing procedures should keep pace with thetechnologies they support. This has long been...
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Applications of ICP-MSMeasuring Inorganic Impuritiesin Semiconductor ManufacturingApplication Compendium > Return to table of contents> Search entire documentTable of contentsICP-MS and ICP-QQQ in the Semiconductor Industry4Agilent Has Three Decades of ICP-MS Experience DrivingContinuous Innovation7Agilent ICP-MS Solutions for the Semiconductor Industry8Automating Analysis of...
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Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode
2019|Agilent Technologies|Aplikace
Application NoteSemiconductorAnalysis of Nanoparticles in OrganicReagents by Agilent 8900 ICP-QQQin spICP-MS ModeDetermination of 25 and 30 nm Fe3O4 NPsin low-particle concentration solutionsAuthorDonna Hsu, YoshinoriShimamura, Brian Liao,and Michiko Yamanaka1Chun-Hua Chen andChiu-Hun Su2Ching Heng Hsu31Agilent Technologies, Inc.Industrial Technology ResearchInstitute of Taiwan, Taiwan23BASF...
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