Shimadzu EDX-LE

Importance of the Topic

The control of hazardous elements in electrical and electronic equipment is critical for compliance with global RoHS and ELV directives. Rapid, non-destructive screening methods are essential for manufacturers, importers, and testing laboratories to verify that materials and products meet strict limits for lead, mercury, cadmium, hexavalent chromium, bromine, chlorine and other regulated elements. The demand for user-friendly instruments that require minimal operator expertise and deliver reliable pass/fail judgments in high-throughput environments continues to grow.

Objectives and Overview

This article presents the EDX-LE energy dispersive X-ray fluorescence spectrometer designed by Shimadzu for RoHS and ELV screening. The primary objectives are to simplify the screening workflow, automate complex analytical decisions, and ensure robust performance across a wide range of sample types and element matrices. Emphasis is placed on guaranteeing ease of use for first-time operators and delivering precise quantitation for regulated elements even at stringent threshold values.

Methodology and Instrumentation

The EDX-LE integrates the following key features and analytical capabilities:

• X-ray generator with Rhodium target covering 5 to 50 kV and up to 1 mA current
• Air-cooled system and automatic filter turret enabling 1, 3, 5 or 10 mm measurement spots
• Silicon PIN semiconductor detector that operates without liquid nitrogen cooling
• Large sample chamber accommodating objects up to 370 mm × 320 mm × 155 mm
• Built-in CCD camera for visual sample positioning and observation
• Automatic calibration curve selection to identify main sample matrix and choose optimal quantitation method
• Shape correction via a built-in scattered X-ray internal standard to compensate for thickness and geometry effects
• Screening software that automates analysis from component determination to pass/fail judgment with a single click
• Optional fundamental parameter, thin-film FP and background FP methods for advanced or non-standard analyses

Main Results and Discussion

The EDX-LE streamlines the entire screening sequence. Operators simply place the sample, select the screening analysis mode, and initiate measurement. The instrument automatically:

• Detects the main material type (metal, plastic or solder)
• Selects the appropriate calibration curve or FP method
• Measures the concentration of each regulated element and computes the 3 sigma variance
• Displays clear pass/fail results along with concentration and variance values for all targets

Benchmark tests demonstrate that light element detection sensitivity has improved by a factor of 1.5 to 5 compared to previous models. The large chamber further broadens application to bulky or irregular objects including entire circuit boards or assembled components. Protection functions prevent unauthorized changes to screening conditions and maintain data integrity.

Practical Benefits and Applications

• Rapid compliance screening of electronics, toys, textiles and other industrial products
• Non-destructive analysis of metals, polymers and multi-layer assemblies
• Minimal training required, reducing labor costs and human error
• Automated software features support high sample throughput and overnight batch processing
• Flexible threshold setting and custom report templates allow adaptation to regional regulations and in-house quality standards

Future Trends and Potential Applications

Advances in detector technology and software automation are expected to drive further enhancements in sensitivity and speed. Integration with laboratory information management systems and cloud-based data analysis platforms will facilitate remote monitoring and real-time compliance reporting. The expansion of regulatory requirements to cover emerging materials such as nanomaterials and advanced composites will create demand for more versatile screening solutions. In situ portable versions may also enable field surveillance in recycling, waste management and on-site manufacturing environments.

Conclusion

The Shimadzu EDX-LE energy dispersive X-ray fluorescence spectrometer offers a comprehensive solution for RoHS/ELV screening that balances ease of use with high analytical performance. By automating critical decision points, delivering precise quantitation for key hazardous elements, and supporting a wide variety of sample formats, the EDX-LE equips laboratories and production facilities with the tools needed to ensure regulatory compliance and maintain quality assurance in fast-paced environments.