Analyzing SiC/Co materials for radar absorption and EMI shielding using ARL X’TRA Companion XRD

Application note | AN41505 X-ray diffraction Quantification of amorphous cementitious materials based on CPL using ARL X’TRA Companion Benchtop XRD Figure 1: ARL X’TRA Companion diffraction system Authors Dr. Simon Welzmiller, Application Specialist XRD, and Raphael Yerly, Product Manager XRD…

Application note | AN41510 Lab equipment Analysis of metakaolin for cost-effective decarbonized cement using ARL X’TRA Companion X-ray Diffractometer Author Dr. Simon Welzmiller, Application Specialist XRD Introduction Instrument & software Metakaolin, a highly reactive pozzolanic material derived from The Thermo…

SMARTNotes #02 XRD investigations in geological and mineralogical fields Author Introduction Eric Berthier, X-Ray diffraction (XRD) is a widely utilized analytical technique for determining the Product Marketing Specialist XRD phase composition of crystalline materials. It is particularly relevant in the…

Application note Determination of the degree of crystallinity in PE using ARL X’TRA Companion X-ray Diffractometer Introduction The degree of crystallinity (DoC) in polymers is determined by analyzing their molecular structure and arrangement. This measurement is crucial as it provides…