Tips and Tricks on ICP-OES for Best Detection Limits and Less Carryover
Agilent Technologies: Tips and Tricks on ICP-OES for Best Detection Limits and Less Carryover
When it comes to detection limits we all want to achieve the lowest possible values.
Learn all the tips and tricks and select proper components of an ICP-OES sample introduction system to optimize your data quality. Take advantage of the smart and easy features of Agilent’s ICP-Expert software to enhance the instrument performance and remove carryover.
Presenter: Sima Singha, PhD (ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.)
Sima has over fifteen years of hands on experience as an applications scientist in the field of atomic spectroscopy. Before joining Agilent in 2017, managed an agricultural chemistry laboratory for the analysis of water, soil, and plant tissue digests using ICP-OES for various EPA methods. She received a Ph.D. degree in Chemistry from the University of Illinois at Chicago with numerous peer-reviewed publications.