ICPMS
Další informace
WebinářeO násKontaktujte násPodmínky užití
LabRulez s.r.o. Všechna práva vyhrazena. Obsah dostupný pod licencí CC BY-SA 4.0 Uveďte původ-Zachovejte licenci.
Pořadatel
Wiley
Již více než 200 let pomáháme lidem a organizacím rozvíjet dovednosti a znalosti, které potřebují k úspěchu. Vyvíjíme řešení digitálního vzdělávání, učení, hodnocení a certifikace, abychom pomohli univerzitám, podnikům a jednotlivcům přejít mezi vzděláváním a zaměstnáním a dosáhnout jejich ambicí.
Tagy
Mikroskopie
Akademie/Principy
X-ray
Logo of LinkedIn

Addressing Challenges in Lithium-Ion Battery Development and Production with Electron Microscopy and X-ray Microtomography

ZÁZNAM | Proběhlo St, 24.4.2024
Role skenovací elektronové mikroskopie (SEM), skenovací elektronové mikroskopie s fokusovaným iontovým svazkem (FIB-SEM) a dalších technik při charakterizaci materiálů lithium-iontových baterií.
Přejít na webinář
Wiley: Addressing Challenges in Lithium-Ion Battery Development and Production with Electron Microscopy and X-ray Microtomography

Wiley: Addressing Challenges in Lithium-Ion Battery Development and Production with Electron Microscopy and X-ray Microtomography

Nowadays, the primary goals of battery research are to optimize production processes, innovate existing battery technologies, and develop new types of energy storage solutions that provide sufficient capacity, long lifespans, fast charging rates, safety, and eco-friendliness contributing to a fossil fuel-free future. Fulfilling these innovation requirements is based on the effective, comprehensive, structural, and chemical multiscale characterization of lithium-ion battery materials.

This talk highlights the pivotal role of advanced microscopy techniques like Scanning Electron Microscopy (SEM), Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM), Scanning Transmission Electron Microscopy (STEM), and micro-computed tomography (micro-CT) in characterizing conventional and next-gen lithium-ion battery materials.

SEM provides detailed views of surface morphology, facilitating analysis of particle properties, degradation mechanisms, contaminants, and structural integrity.

FIB-SEM extends this analysis with subsurface and three-dimensional characterization, revealing chemistry and internal micro- and nanostructures including solid electrolyte interphase, and phenomena like voids, cracks and delamination.

STEM enables a nanoscale compositional characterization of battery active materials and components, including their surfaces and interfaces.

Micro-CT offers non-destructive, three-dimensional imaging, capturing intricate details of the battery cell or module architecture and materials, all providing insights into battery quality, behavior, and failure mechanisms.

These techniques empower researchers to optimize battery properties, identify and prevent failure, and develop sustainable energy solutions. They address challenges posed by material chemistries and battery processes, guiding advancements in battery design and production.

Presenter: Dr. Dean Miller (Principal Scientist, TESCAN USA)

Dean Miller received his B.S. in Metallurgical Engineering and Ph.D. in Materials Science, both from the University of Illinois in Champaign-Urbana. He was a Senior Materials Scientist at Argonne National Laboratory for 30 years, including serving as Director for the Electron Microscopy Center at Argonne. His research focuses on the characterization of complex electronic oxides including advanced battery materials, magnetic oxides, and high-temperature superconductors with a particular emphasis on characterization by electron beam methods.

Presenter: Vick Singh (Senior Vice President of Technology, Dragonfly Energy Corp.)

Vick Singh is an accomplished energy technology professional who has been instrumental in overseeing the development of next-generation lithium-ion batteries, manufacturing processes, and the optimization of battery chemistries. He holds a Ph.D. in Materials Science and Engineering from the University of Nevada, Reno, and a B.S. in Chemical Engineering from the University of Tennessee, Knoxville.

Wiley
 

Mohlo by Vás zajímat

Utilizing hyphenated EC-Raman to study a model system

Aplikace
| 2024 | Metrohm
Instrumentace
RAMAN Spektrometrie
Výrobce
Metrohm
Zaměření
Průmysl a chemie

Agilent Automation (ICP/MS & ICP/OES)

Brožury a specifikace
| 2024 | Agilent Technologies
Instrumentace
ICP/MS, ICP/OES
Výrobce
Agilent Technologies
Zaměření
Ostatní

Analysis of Elemental Impurities in Lithium-Ion Secondary Battery Electrolytes Using the ICPE- 9800 Series

Aplikace
| 2024 | Shimadzu
Instrumentace
MP/ICP-AES
Výrobce
Shimadzu
Zaměření
Průmysl a chemie

OMNIS NIRS

Brožury a specifikace
| 2024 | Metrohm
Instrumentace
NIR Spektroskopie, Software
Výrobce
Metrohm
Zaměření
Ostatní

Improved Lab Efficiency with the Agilent 18-Cell Changer Accessory

Technické články
| 2024 | Agilent Technologies
Instrumentace
UV–VIS Spektrofotometrie
Výrobce
Agilent Technologies
Zaměření
Ostatní
Další projekty
Sledujte nás
Další informace
WebinářeO násKontaktujte násPodmínky užití
LabRulez s.r.o. Všechna práva vyhrazena. Obsah dostupný pod licencí CC BY-SA 4.0 Uveďte původ-Zachovejte licenci.