Specialty Chemical Analysis using ICP-OES and AA

The semiconductor industry uses a wide range of specialty chemicals in various steps of the manufacturing process.

Analysis and control of the elemental impurities in these reagents are essential for ensuring the integrity of the final product. In this webinar we will discuss how to overcome the challenges of trace level of impurity analysis in challenging matrices on ICP-OES and AA.

Presenter: Sima Singha, PhD (ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.)

Sima has over fifteen years of hands on experience as an applications scientist in the field of atomic spectroscopy. Before joining Agilent in 2017, managed an agricultural chemistry laboratory for the analysis of water, soil, and plant tissue digests using ICP-OES for various EPA methods. She received a Ph.D. degree in Chemistry from the University of Illinois at Chicago with numerous peer-reviewed publications.

Presenter: Chris Conklin (Atomic Spectroscopy Product Specialist, Agilent Technologies, Inc.)

With a degree from the University of Wisconsin – Eau Claire, Chris worked in, and lead, a quality control lab testing fine chemicals ranging from reagent grade to high purity. Over the course of 12 years in that role, Chris has run a variety of atomic elemental instruments and techniques including AA, ICP-OES, and ICP-MS. As a result, he has seen most of the periodic table in its elemental form and overcome the associated interferences. In 2018, Chris brought that knowledge and experience to his current role with Agilent as the Product Specialist for Atomic Spectroscopy supporting AA, MP-AES, and ICP-OES for the Eastern US.