Removing Spectral Interferences on ICP-OES: Which Correction Technique is Better, IEC or FACT?

The analysis of trace elements can be challenging sometimes due to spectral interferences originating from the high concentrations of other elements in the sample. In this webinar we will discuss about how to identify spectral interferences that you may encounter and will compare different techniques for correction such as Fitted background correction, Inter – Element Correction (IEC), and Fast Automated Curve-fitting Technique (FACT).

Presenter: Sima Singha, PhD (ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.)

Sima has over fifteen years of hands on experience as an applications scientist in the field of atomic spectroscopy. Before joining Agilent in 2017, managed an agricultural chemistry laboratory for the analysis of water, soil, and plant tissue digests using ICP-OES for various EPA methods. She received a Ph.D. degree in Chemistry from the University of Illinois at Chicago with numerous peer-reviewed publications.