The Dawn of a New Era in EBSD Technology
Discover eWARP - The Fastest & Most Signal Efficient EBSD Detector Ever
Electron Backscatter Diffraction (EBSD) is a crucial technique for microstructural analysis in the SEM, with widespread use in both academia and industry. Since the first pioneering automated EBSD systems were introduced in the 1990s the technique has seen significant advancements in both hardware and software, leading to sustained improvements in speed, spatial resolution and data quality. However, recently progress has plateaued due to the limitations of the indirect detection method used in contemporary detectors.
This webinar will introduce our new Direct Electron Detector (DED) EBSD detector, eWARP - which solves speed limitations while maximizing signal efficiency. This new solution employs a hybrid pixel sensor a.k.a. pixelated sensor technology, specifically designed for EBSD applications.
We will explore the benefits and performance of this custom pixelated sensor technology alongside relevant application examples.
Whether you are looking to enhance your research or stay at the forefront of technology, this webinar offers valuable insights into how our detector will reshape the EBSD landscape.
Why Should Attend
- All EBSD and SEM users.
- Anyone interested in microanalysis.
- Anyone interested in the development of advanced materials.
Presenter: Dr. Daniel Goran (Product Manager EBSD, Bruker Electron Microscope Analyzers)
Presenter: Dr. Meriem Ben Haj Slama (Application Scientist EBSD, Bruker Electron Microscope Analyzers)
