Shed Light on Surface | How to use FT-IR to characterize surfaces
FT-IR spectroscopy is an easy-to-use and nondestructive analysis tool for chemical identification, quantification, composition analysis, optical characterization and many more. Depending on measurement geometry (beside transmission measurement) and optical properties of sample materials FT-IR can be very surface sensitive. It provides plenty of surface analysis techniques with different penetration depth to qualitatively or quantitatively characterize the upper layer of a sample, to follow surface reactions or to observe surface emissions etc. Depending on sample form, e.g. powder, gel, liquid, crystal blocks, coatings, micro sized samples or else, different FT-IR techniques can be applied.
In this Webinar You Will Learn:
- Attenuated Total Reflection - ATR
- Diffuse Reflectance Infrared Fourier Transform Spectroscopy - DRIFT
- Specular Reflectance
- InfraRed Reflection Absorption Spectroscopy - IRRAS
- Emission Spectroscopy
- Photo Acoustic Spectroscopy - PAS
Who Should Attend?
- Surface analysis experts (e.g. material science, polymers, automotive…)
- Spectroscopy experts (e.g. academia, physicists, chemists…)
- Microscopy experts (e.g. research, pharmaceuticals, electronics… )
Presenter: Dr. Xia Stammer
Dr. Xia Stammer studied Physical Chemistry and focused on surface functionalization and characterization during her PhD and research activities. She has been FT-IR application specialist since almost 10 years at Bruker and is specialized for FT-IR research solutions for catalysis, material science and surface analysis.
Presenter: Dr. Inga Köhler
Dr. Inga Köhler studied Geology and Paleontology and acquired her PhD with focus on Early Earth. Inga has a strong interest in communicating scientific topics to the public and continues to contribute to Archean research. At Bruker, she works as a Scientific Content Creator for FT-IR and Raman spectroscopy as well as microscopy.
