Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
ZÁZNAM | Proběhlo Ne, 1.1.2023
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Bruker: Two Complementary Nanoscale IR Techniques: Photothermal AFM-IR and s-SNOM
This webinar introduces two main techniques for nanoscale IR measurements: Photothermal AFM-IR (PTIR/AFM-IR) and IR-based Scattering Scanning Nearfield Optical Microscopy (IR s-SNOM).
The presenter, Dr. Phillips, differentiates AFM-IR and s-SNOM by comparing them to more familiar techniques:
- AFM-IR is like a nanoscale FTIR
- s-SNOM is like a nanoscale ellipsometry
Dr. Phillips delves into the fundamentals behind AFM-IR and s-SNOM. Both complementary modes are combined in Bruker’s nanoIR3-s platform.
Also included in this in-depth introductory webinar are:
- Exemplary case studies for both AFM-IR and s-SNOM
- System configuration descriptions, accompanied by real-machine images
- An extensive Q&A session, where the presenter answers audience questions
In the Q&A session, viewers can expect to hear the answers to:
- Can AFM-IR be performed in fluid?
- What are typical sample requirements for nanoscale IR techniques?
- What is the probing depth of the laser and that of each technique?
- Can nanoscale IR techniques be performed using a synchrotron source?
- watch part 2: Online Demo of the nanoIR3 System - Photothermal AFM-IR
- watch part 3: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR
- watch part 4: Nanoscale AFM-IR Spectroscopy and Imaging for Failure Analysis of Electronic Devices
- watch part 5: 2D Material Characterization Using Photothermal AFM-IR and s-SNOM
Presenter: Cassandra Phillips, Ph.D. Bruker expert
Bruker
