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A Faster, More Accurate Way of Characterizing Cube Beamsplitters

 

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Application Note Materials A Faster, More Accurate Way of Characterizing Cube Beamsplitters Using the Agilent Cary 7000 universal measurement spectrophotometer (UMS) Authors Abstract Travis Burt and Chris Colley Agilent Technologies Mulgrave, Victoria, Australia Cube beamsplitters (CBS) are critical optical components…
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polarized, polarizedbeamsplitter, beamsplittercoating, coatingcbs, cbswavelength, wavelengthbeamsplitters, beamsplittersoptical, opticalcube, cubebeam, beampolarization, polarizationincident, incidentreflected, reflectedangle, anglecement, cementillumination
Applications of UV-Vis-NIR Optical Characterization of Materials Using Spectroscopy Application Compendium > Return to table of contents Table of contents Introduction  4 Optics  5 Characterizing Sub-Nanometer Narrow Bandpass Filters  Evaluation of the Cary Specular Reflectance Accessory for…
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optical, opticalreturn, returnreflectance, reflectancecontents, contentstable, tableangle, angleincidence, incidencemeasurements, measurementswavelength, wavelengthtransmittance, transmittancereflection, reflectionspectrophotometer, spectrophotometermeasurement, measurementcoating, coatingbeam
Molecular Spectroscopy Application eHandbook
2017|Agilent Technologies|Příručky
Home Previous Next TABLE OF CONTENTS COATING CHALLENGES INSTRUMENT OVERVIEW + MEASUREMENTS OF COATINGS OTHER COATING TECHNOLOGIES GATHER RICH INSIGHTS FROM COATINGS ANALYSIS Molecular Spectroscopy Application eHandbook Home Previous Next TABLE OF CONTENTS COATING CHALLENGES INSTRUMENT OVERVIEW + MEASUREMENTS OF…
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Application Note Materials Investigating the Angular Dependence of Absolute Specular Reflection Using the Agilent Cary 7000 universal measurement spectrophotometer (UMS) Authors Travis Burt and Chris Colley Agilent Technologies, Inc. Mulgrave, Victoria Australia Introduction When characterizing an optical sample it is…
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aoi, aoispecular, specularreflection, reflectionums, umsangular, angularwavelength, wavelengthbeam, beamillumination, illuminationpolarization, polarizationabsolute, absolutewafer, waferincident, incidentdegrees, degreessilicon, siliconreflectance
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