Optical Characterization of Thin Films
Aplikace | 2022 | Agilent TechnologiesInstrumentace
NIR Spektroskopie, UV–VIS Spektrofotometrie
ZaměřeníMateriálová analýza
VýrobceAgilent Technologies
Klíčová slovaangle, optical, films, thin, incidence, engineering, uma, multi, reverse, measurement, spectral, coatings, reflectance, multilayer, accessory, transmittance, characterization, data, photometric, normal, thicknesses, beam, thickness, dense, assembly, near, various, spectroscopy, using, evaporated, nir, refractive, combinations, measurements, applicability, input, film, transmission, experimental, vis, universal, measured, reliability, physical, layer, absolute, index, francis, dependencies, magnetron
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