ICPMS
Další informace
WebinářeO násKontaktujte násPodmínky užití
LabRulez s.r.o. Všechna práva vyhrazena. Obsah dostupný pod licencí CC BY-SA 4.0 Uveďte původ-Zachovejte licenci.

High sensitivity analysis of SiO2 nanoparticles using the Agilent 8900 ICP-QQQ in MS/MS mode

Aplikace | 2016 | Agilent TechnologiesInstrumentace
ICP/MS, ICP/MS/MS
Zaměření
Životní prostředí, Potraviny a zemědělství, Materiálová analýza
Výrobce
Agilent Technologies
Klíčová slova
PDF verze ke stažení a čtení
 

Podobná PDF

Toggle
Application Note Semiconductor Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ Characterization of Ag, Fe3O4, Al2O3, Au, and SiO2 NPs in TMAH in a single analytical run Author Yoshinori Shimamura, Donna Hsu, and Michiko Yamanaka Agilent Technologies, Inc. Introduction…
Klíčová slova
cps, cpsfrequency, frequencynanoparticle, nanoparticleparticle, particlecount, countnormalized, normalizedtmah, tmahsize, sizeelement, elementsec, secintensity, intensitysignal, signalnanoparticles, nanoparticlestime, timenebulization
Application Note Semiconductor Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS Accurate detection of insoluble SiO2 NPs in high purity acids and solvents by Agilent 8900 ICP-QQQ Authors Introduction Donna Hsu, Brian Liao, Katsuo Mizobuchi, Michiko…
Klíčová slova
spicp, spicpsemiconductor, semiconductoricp, icpnanoparticle, nanoparticlesingle, singlemodule, moduleapplication, applicationbackground, backgroundused, usedincreasingly, increasinglyrate, ratemethod, methodmasshunter, masshuntermin, mingas
Application Note Semiconductor Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode Determination of 25 and 30 nm Fe3O4 NPs in low-particle concentration solutions Author Donna Hsu, Yoshinori Shimamura, Brian Liao, and Michiko Yamanaka1 Chun-Hua Chen…
Klíčová slova
particle, particlesize, sizefrequency, frequencynps, npsconcentration, concentrationspicp, spicpbuac, buacpgmea, pgmeacps, cpsipa, ipasignal, signalnormalized, normalizedspiked, spikedwere, werenanoparticle
Yoshinori Shimamuraand Satoshi Kondo Particle Analysis of Two High Purity Grades of N-Methyl-2Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method Agilent Technologies, Inc., Tokyo, Japan Sample analysis performed in collaboration with Kakeru Usuba, Naoki Katano, and Takao Shibasaki EWCPS 2023 Th…
Klíčová slova
nps, npsnmp, nmpelement, elementparticle, particlespicp, spicptra, traicp, icpgrade, gradefast, fastnebulization, nebulizationnanoparticle, nanoparticleparticles, particlesdistribution, distributiondiscriminaton, discriminatonkondo
Další projekty
Sledujte nás
Další informace
WebinářeO násKontaktujte násPodmínky užití
LabRulez s.r.o. Všechna práva vyhrazena. Obsah dostupný pod licencí CC BY-SA 4.0 Uveďte původ-Zachovejte licenci.